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Analysis of high-power diode laser thermal properties by micro-Raman spectroscopy

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Author(s): Dorota WAWER | Jens W. TOMM | Kamil PIERSCINSKI | Maciej BUGAJSKI

Journal: Optica Applicata
ISSN 0078-5466

Volume: 35;
Issue: 3;
Start page: 555;
Date: 2005;
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Keywords: Raman spectroscopy | catastrophic optical mirror damage (COMD) | high-power laser | thermoreflectance

ABSTRACT
Spatially resolved micro-Raman measurements have been performed to determine temperature distribution over the facet of high power semiconductor diode lasers. This technique is non-invasive and allows one to study the local temperature on the surface of the mirror of semiconductor diode lasers under normal operating conditions. The micro-Raman measurements can also serve as a calibration of absolute temperature for the other contact-less thermometric methods, e.g., thermoreflectance.

Tango Jona
Tangokurs Rapperswil-Jona

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