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Analysis and Simulation of Functional Stress Degradation on VDOMS Power Transistors

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Author(s): M. Zoaeter | B. Beydoun | M. Hajjar | M. Debs | J-P Charles

Journal: Active and Passive Electronic Components
ISSN 0882-7516

Volume: 25;
Issue: 3;
Start page: 215;
Date: 2002;
Original page
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