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Application of dynamic impedance spectroscopy to atomic force microscopy

Author(s): Kazimierz Darowicki, Artur Zieliński and Krzysztof J Kurzydłowski

Journal: Science and Technology of Advanced Materials
ISSN 1468-6996

Volume: 9;
Issue: 4;
Start page: 045006;
Date: 2008;
Original page

Keywords: atomic force microscopy | dynamic electrochemical impedance spectroscopy | non-stationarity

Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.
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