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Application of Dynamic Supply Current Monitoring toTesting Mixed-Signal Circuits

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Author(s): Mahmoud A. Al-Qutayri | Peter R. Shepherd

Journal: VLSI Design
ISSN 1065-514X

Volume: 5;
Issue: 3;
Start page: 223;
Date: 1997;
Original page

Keywords: CMOS | VLSI | mixed-signal | supply current | testability | fault coverage.
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