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Automated complex for thermoresistive properties investigation of nanostructured film systems

Author(s): V.A. Zlenko | S.I. Protsenko | R. Safaric

Journal: Journal of Nano- and Electronic Physics
ISSN 2077-6772

Volume: 1;
Issue: 2;
Start page: 29;
Date: 2009;
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Keywords: Thin Film | LabVIEW 8.6 | Thermal Coefficient of Resistance

Using industrial controllers of Advantech ADAM-4000 Company and system of graphic programming LabVIEW 8.6 the automated complex for thermoresistive properties investigation of film systems is developed. Approbation of the complex on example of Ni/Fe film system obtained by layered condensation is carried out.
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