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Built-In Self-Test: Milestones and Challenges

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Author(s): Jacob Savir | Paul H. Bardell

Journal: VLSI Design
ISSN 1065-514X

Volume: 1;
Issue: 1;
Start page: 23;
Date: 1993;
Original page

Keywords: BIST | Test generation | Fault simulation | Signature analysis | Exhaustive test | Signal probability | Detection probability | Random test | Weighted random test.
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