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Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

Author(s): Vishwanath Natarajan | Rajarajan Senguttuvan | Shreyas Sen | Abhjit Chatterjee

Journal: VLSI Design
ISSN 1065-514X

Volume: 2008;
Date: 2008;
Original page

Built-In RF test is a challenging problem due to the need to measure the values of complex test specifications on-chip with the precision of external RF test equipment. BIT techniques are necessary for guiding system adaptation during field operation. Prior research has demonstrated that embedded RF sensors can generate significant information about RF circuit performance. In this paper, we propose a test methodology that enables efficient BIT and BIT-enabled tuning of RF systems. A test generation approach is developed that co-optimizes the applied test stimulus, the type of embedded sensors, and the system response capture mechanisms for maximal accuracy of the BIT procedure. This BIT technique is also used to perform diagnostic testing of the transmitter. The information gathered from diagnosis is used to tune the transmitter for improved performance. Simulation results demonstrate that BIT-assisted diagnosis and tuning can be performed with good accuracy using the proposed methodology.
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