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Calculation of the System Focusing Electron Beam in the Ion Source of Mass Spectrometer with Electron Impact Ionization

Author(s): О.S. Kuzema | P.O. Kuzema

Journal: Journal of Nano- and Electronic Physics
ISSN 2077-6772

Volume: 3;
Issue: 3;
Date: 2011;
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Keywords: Mass spectrometer | Ion source | Ionization chamber | Magnetic field | Electron Beam.

It has been found the correlations for the parameters of electron movement and it has been determined the value for magnetic induction in the region of ionization chamber providing the electron beam passage through the space of ionization chamber without its broadening.
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