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Characterization and Electrochemical Properties of RuO2 Film Electrode on the Inner-wall of Tantalum Shell for Capacitor

Author(s): GAN Wei-Ping, LIU Ji-Yu, LIU Hong, LI Xiang, MA He-Ran

Journal: Journal of Inorganic Materials
ISSN 1000-324X

Volume: 25;
Issue: 8;
Start page: 882;
Date: 2010;
Original page

Keywords: tantalum capacitors; ruthenium dioxide (RuO2); thin film electrode

Using the methods of coated and thermal decomposed ruthenium chloride, the RuO2 thin film was synthesized on the inner-wall surface of tantalum shell. Its morphology and structure were characterized by scanning electron microscope and X-ray diffraction. The electrochemical performances of the RuO2 thin film electrode were tested by cyclic voltammetry, galvanostatic charging/discharging and electrochemical impedance spectroscope. The results show that the RuO2 thin film calcinated at 280¡䟨as amorphous structure and the specific capacitance of the electrode is 212F/g (in 0.5 mol/L H2SO4 electrolyte) with good electrochemical performance. When the films are assembled into ST3 type 60 V 330 μF tantalum capacitors, the capacitance can still maintain 345μF after celaring and electrical aging. The equivalent series resistance (ESR) is less than 1Ω and the leakage current is less than10μA.

Tango Jona
Tangokurs Rapperswil-Jona

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