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Closed Form Aliasing Probability For Q-ary Symmetric Errors

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Author(s): Geetani Edirisooriya

Journal: VLSI Design
ISSN 1065-514X

Volume: 4;
Issue: 3;
Start page: 199;
Date: 1996;
Original page

Keywords: Built-In Self-Test | Aliasing probability | LFSR | MISR | Cellular automata | Q-ary symmetric channel.
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