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Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks

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Author(s): Juan A. Gomez-Pulido | Florentino Sanchez-Bajo | Sidolina Pereira dos Santos | Miguel A. Vega-Rodriguez | Juan M. Sanchez-Perez

Journal: X-Ray Optics and Instrumentation
ISSN 1687-7632

Volume: 2008;
Date: 2008;
Original page

ABSTRACT
A custom processor based on reconfigurable hardware technology is proposed in order to compute the figure of merit used to measure the quality of the fit of X-ray diffraction peaks. As the experimental X-ray profiles can present many peaks severely overlapped, it is necessary to select the best model among a large set of reasonably good solutions. Determining the best solution is computationally intensive, because this is a hard combinatorial optimization problem. The proposed processors, working in parallel, increase the performance relative to a software implementation.
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