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Degradation of Junction Parameters of an ElectricallyStressed NPN Bipolar Transistor

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Author(s): N. Toufik | F. PĂ©lanchon | P. Mialhe

Journal: Active and Passive Electronic Components
ISSN 0882-7516

Volume: 24;
Issue: 3;
Start page: 155;
Date: 2001;
Original page
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