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Derivation of Scherrer Relation Using an Approach in Basic Physics Course

Author(s): Mikrajuddin Abdullah | Khairurrijal

Journal: Jurnal Nanosains & Nanoteknologi
ISSN 1979-0880

Volume: 1;
Issue: 1;
Start page: 28;
Date: 2008;
Original page

Keywords: Scherrer relation | multi slits interference | Y2O3

Size of nanoparticles can be predicted using a simple Scherrer relation, based on the width of X-ray diffraction (XRD) patterns of materials. In present paper we derive the Scherrer relation using a “multi slits interference” approach studied in basic physics course. We found the dependence of crystallites size on the broadness of the XRD peak is exactly the same as the original Scherrer formula. A simple procedure on using the Scherrer formula for predicting the crystallite sizes of Y2O3 material is also discussed.
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