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Determination of the Nanoparticle Sizes Using AFM Images and Simulation of their Magnetooptical Properties

Author(s): V.A. Zlenko | M.H. Demydenko | S.I. Protsenko

Journal: Journal of Nano- and Electronic Physics
ISSN 2077-6772

Volume: 5;
Issue: 3;
Start page: 03055-1;
Date: 2013;
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Keywords: Atomic-force microscopy | Nanoparticle array | MOK

This paper describes the geometric models and presents the calculation results of the actual sizes of Ni and Co nanoparticles on the amorphous Si3N4 / Si substrates obtained by thermal annealing of thin metal films using the data of atomic force microscopy. Results were used in the simulation of magneto-optical properties of arrays of nanoparticles. It is shown that processed by described in the paper equations models allow to obtain a good agreement between calculated and experimentally obtained by MOKE method data.
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