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Determination of radiation resistance of integrated circuits with the use of low-energy X-radiation

Author(s): Perevertailo V. L.

Journal: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
ISSN 2225-5818

Issue: 1;
Start page: 30;
Date: 2012;
Original page

Keywords: radiation testing | low-energy X-rays | MOS-structure | IC radiation hardness

A method is proposed for determination of radiation dose via the ionization current in the p—n-junction and of radiation resistance of MIS integrated circuits with the use of low-energy (10—40 keV) X-rays.
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