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Efficient Structure for Testing Operational Amplifiers .

Author(s): Venkatesh Kumar.N | Raghavendra | Praveen | Praveen

Journal: International Journal of Engineering Sciences & Research Technology
ISSN 2277-9655

Volume: 2;
Issue: 5;
Start page: 1237;
Date: 2013;
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Rapid advances in application specific integrated circuits have posed a challenge in both design and test of analog components to provide consistent circuit performance. In this paper, a structure is proposed and designed that will help the ASIC industries in testing analog components. The Op-Amp under test is configured as voltage follower and the signature is analyzed using digital circuitry.
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