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Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation

Author(s): Ameet Chavan | Praveen Palakurthi | Eric MacDonald | Joseph Neff | Eric Bozeman

Journal: Journal of Low Power Electronics and Applications
ISSN 2079-9268

Volume: 2;
Issue: 2;
Start page: 168;
Date: 2012;
Original page

Keywords: ultra-low voltage operation | subthreshold | SEU | flip-flop | rad-hard

A novel Single Event Upset (SEU) tolerant flip-flop design is proposed, which is well suited for very-low power electronics that operate in subthreshold (
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