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Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

Author(s): Ameet Chavan | Praveen Palakurthi | Eric MacDonald | Joseph Neff | Eric Bozeman

Journal: Journal of Low Power Electronics and Applications
ISSN 2079-9268

Volume: 2;
Issue: 4;
Start page: 210;
Date: 2012;
Original page

Keywords: n/a

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