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Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors

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Author(s): A. Cattaneo | M. Cocito | F. Forlani | M. Prudenziati

Journal: Active and Passive Electronic Components
ISSN 0882-7516

Volume: 4;
Issue: 3-4;
Start page: 205;
Date: 1977;
Original page
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