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Laser ablation and photostimulated passivation of the surface of Cd1–хZnхTe crystals

Author(s): Zagoruiko Yu. A. | Kovalenko N. O. | Khristyan V. A. | Fedorenko O. A. | Gerasimenko A. S. | Dobrotvorskaya M. V. | Mateychenko P. V.

Journal: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
ISSN 2225-5818

Issue: 3;
Start page: 35;
Date: 2011;
Original page

Keywords: Cd1-hZnhTe detector | photostimulated surface passivation | laser ablation | leakage currents

A new physical method of Cd1–хZnхTe-detectors passivation is proposed — the treatment of crystal surface by a laser ablation (LA) with subsequent photostimulated passivation (PhSP), during wich a high-resistance oxide layer is formed on it’s surface after the surface cleaning under intensive light irradiation effect. It is shown that the method of LA+PhSP is manufacturable and in comparison with PhSP and PhESP methods developed earlier provides a thick, homogeneous and high-oxide films, which significantly increases the surface resistivity of Cd1–хZnхTe samples and reduces leakage currents in them.
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