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A Line Segments Matching Method based on Epipolar-line Constraint and Line Segment Features

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Author(s): Jie-xian Zeng | Sheng Yu | Xiang Fu | Chao-xia Li

Journal: Journal of Software
ISSN 1796-217X

Volume: 6;
Issue: 9;
Start page: 1746;
Date: 2011;
Original page

Keywords: epipolar-line constraint | line segment featrurs | line segments matching

ABSTRACT
Line segments are ordinary in industrial scene, accurate line segments matching is a key step for many applications, such as 3-D reconstruction. A matching method based on epipolar-line constraint and line segment features is proposed. Firstly, the points on line segments between image pairs are matched by epipolar-line constraint. Secondly, geometric descriptor and gray value descriptor are used to describe the line segment features, then the two descriptors are combined into a feature vector, and Euclidean distance between vectors is used to achieve fine match. Experiment results show that the proposed method is accurate and fast.
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