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The measurement errors of X-ray devices features

Author(s): Dushkin S. A. | Ivanskiy V. B. | Kurov A. M. | Odinets V. A. | Orobinskiy A. N.

Journal: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
ISSN 2225-5818

Issue: 3;
Start page: 44;
Date: 2011;
Original page

Keywords: X-rays | X-ray machine | average energy | coefficient of homogeneity | half-attenuation layer

Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement and calculation of features of X-ray installation with requirements to errors of standard X-ray radiation features with narrow spectrum on DSTU ISO 4037-1:2006. Criteria of choosing the additional filters thickness for measurement 1st HVL and 2nd HVL are defined. The errors resulting from calculation of mean photon energy of X-ray radiation and homogeneity coefficient are specified.
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