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Modeling of the I–V Characteristics for LDD-nMOSFETs in Relation with Defects Induced by Hot-Carrier Injection

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Author(s): R. Marrakh | A. Bouhdada

Journal: Active and Passive Electronic Components
ISSN 0882-7516

Volume: 26;
Issue: 4;
Start page: 197;
Date: 2003;
Original page
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