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Optical Characteristics and Composition OF Cd1 – xMnxTe Films Obtained by the Close Spaced Sublimation Technique

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Author(s): V.V. Kosyak | A.S. Opanasyuk | P.V. Koval | P.M. Fochuk | V.V. Starikov

Journal: Journal of Nano- and Electronic Physics
ISSN 2077-6772

Volume: 3;
Issue: 2;
Date: 2011;
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Keywords: Cd1 – xMnxTe Solid Solution Films | Transmission Coefficient | Reflection Coefficient | Wide Band Gap | Layer Composition

ABSTRACT
Study of the optical properties of Cd1 – xMnxTe films obtained by the close spaced sublimation technique was carried out. Measuring of the optical characteristics of the layers was performed by the spectrophotometric analysis method near the “red boundary” of the semiconductor photoactivity. This research allowed to obtain the spectrum distributions of the transmission T(λ), reflection R(λ) and absorption α(λ) coefficients of the films as well as estimate the band-gap energy of the compound. The values of the band-gap energy were used for determination of manganese concen-trations in the films depending on the growth conditions.
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