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Optical Methods in Orientation of High-Purity Germanium Crystal

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Author(s): Guojian Wang | Yongchen Sun | Yutong Guan | Dongming Mei | Gang Yang | Angela Alanson Chiller | Bruce Gray

Journal: Journal of Crystallization Process and Technology
ISSN 2161-7678

Volume: 03;
Issue: 02;
Start page: 60;
Date: 2013;
Original page

Keywords: Reflection Method | High-Purity Germanium Crystal

ABSTRACT
Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals.
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