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Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique

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Author(s): Amany El Nahrawy | Inas Battisha

Journal: Advances in Molecular Imaging
ISSN 2161-6728

Volume: 02;
Issue: 01;
Start page: 17;
Date: 2012;
Original page

Keywords: Sol-Gel | Nano-Structure SiO&lt | sub&gt | 2&lt | /sub&gt | P&lt | sub&gt | 2&lt | /sub&gt | O&lt | sub&gt | 5&lt | /sub&gt | Thin Film | Scanning Electron Microscopy (SEM) | XRD and FTIR

ABSTRACT
A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).
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