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Relaxor properties of Ba1-xNaxTi1-xNbxO3 at low temperatures

Author(s): W. Bąk

Journal: Archives of Materials Science and Engineering
ISSN 1897-2764

Volume: 34;
Issue: 1;
Start page: 23;
Date: 2008;
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Keywords: Ceramics | Relaxor | Electrical properties | Dielectric relaxation spectroscopy

Purpose: The purpose of this paper is to investigate ferroelectric relaxor behavior of polycrystalline solidsolutions of Ba1-xNaxTi1-xNbxO3 (for x = 0.3 and x = 0.4) at low temperatures (113 K - 473 K).Design/methodology/approach: The dielectric spectroscopy method has been applied to measure dielectricand electric parameters within the frequencies from 20 Hz to 1 MHz.Findings: Temperature dependences of real (ε’) and imaginary (ε”) parts of dielectric permittivity confirm relaxortype of polarization behavior for both investigated materials. Experimental findings are in good agreement withdata published in literature. Diffused phase transition of relaxor character is analysed in the terms of departurefrom Curie-Weiss rule. A dependence of the temperature related to the maximum of dielectric permittivity on thefrequency has activated character. Different thermal activation energies found for the investigated materials maybe related to their different microstructures.Research limitations/implications: Further investigations should be carried on in a broaden frequency range(up to 1.8 GHz) in order to establish an influence of network dynamics on ferroelectric-paraelectric phase transition.Originality/value: Relaxor behaviour in polycrystalline solid solution of Ba1-xNaxTi1-xNbxO3 (for x = 0.3 andx = 0.4) is described.
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Tango Rapperswil
Tango Rapperswil