Author(s): Dimitry Polivaev
Journal: Electronic Proceedings in Theoretical Computer Science
ISSN 2075-2180
Volume: 80;
Issue: Proc. MBT 2012;
Start page: 103;
Date: 2012;
Original page
ABSTRACT
This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.
Journal: Electronic Proceedings in Theoretical Computer Science
ISSN 2075-2180
Volume: 80;
Issue: Proc. MBT 2012;
Start page: 103;
Date: 2012;
Original page
ABSTRACT
This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.
