Academic Journals Database
Disseminating quality controlled scientific knowledge

Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity

ADD TO MY LIST
 
Author(s): B. Affour | P. Mialhe

Journal: Active and Passive Electronic Components
ISSN 0882-7516

Volume: 19;
Issue: 4;
Start page: 225;
Date: 1997;
Original page

Tango Rapperswil
Tango Rapperswil

     Affiliate Program