Academic Journals Database
Disseminating quality controlled scientific knowledge

Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity

ADD TO MY LIST
 
Author(s): B. Affour | P. Mialhe

Journal: Active and Passive Electronic Components
ISSN 0882-7516

Volume: 19;
Issue: 4;
Start page: 225;
Date: 1997;
Original page
Save time & money - Smart Internet Solutions      Why do you need a reservation system?