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The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

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Author(s): Artem Ganiyev | Jan Vitasek

Journal: Advances in Electrical and Electronic Engineering
ISSN 1336-1376

Volume: 8;
Issue: 2;
Start page: 48;
Date: 2010;
Original page

Keywords: Large scale integration circuit | very large scale integration circuit | integrated circuit | memory component | program equipment | telecommunication system.

ABSTRACT
This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits.
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