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Spectroscopic Characterization of GaAs and AlxGa1 – xAs / AlyGa1 – yAs Quantum Well Heterostructures

Author(s): Mirgender Kumar | V.P. Singh

Journal: Journal of Nano- and Electronic Physics
ISSN 2077-6772

Volume: 5;
Issue: 3;
Start page: 03006-1;
Date: 2013;
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Keywords: Photoreflectance spectroscopy | Surface photovoltaic spectroscopy | HRXRD | Heterostructure

This work presents the results of the characterization of GaAs and AlxGa1 – xAs / AlyGa1 – yAs quantum well hetero-structures growth by MOVPE system. The main goal is to explore the ability of characterization techniques for multilayer structures like quantum wells. The characterization was performed using photoreflectance spectroscopy, surface photovoltaic spectroscopy and X-ray diffraction. The experimental results are verified by numerical simulation.
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