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Studies of polymer surface topography by means of optical profilometry

Author(s): Janusz Jaglarz | Jerzy Sanetra | Jan Cisowski

Journal: Optica Applicata
ISSN 0078-5466

Volume: 40;
Issue: 4;
Start page: 767;
Date: 2010;
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Keywords: optical profilometry | thin polymeric films

The optical reflection measurements of polyvinylocarbazole (PVK) and polyazomethine (PPI)  thin films have been done by means of optical profilometry (OP) exhibiting many advantages  in surface and subsurface investigations. The obtained OP images clearly demonstrate that the thickness of the polymer films under investigation is not uniform over their lateral dimensions. For the PVK thin film, the fast Fourier transform (FFT) in the inverse space of the OP image is also presented along with distribution of the surface highs.

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