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Thermal and Dielectric Studies On Ge10se69tl21 Chalcogenide Glass

Author(s): B.J. Madhu | H.S. Jayanna | S. Asokan

Journal: Journal of Nano- and Electronic Physics
ISSN 2077-6772

Volume: 3;
Issue: 1;
Start page: 308;
Date: 2011;
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Keywords: Chalcogenide Glass | Thermal Analysis | Alternating Differential Scanning Calorimetry | Dielectric Properties | Dielectric Constant | Dielectric Loss Factor

Bulk Ge10Se69Tl21 chalcogenide glass is prepared by melt quenching technique. Thermal analysis of bulk Ge10Se69Tl21 glass has been undertaken using temperature modulated Alternating Differential Scanning Calorimetry (ADSC). The Ge10Se69Tl21 glass is found to exhibit single glass transition temperature (Tg) and double stage crystallization reactions (Tc1 & Tc2). The dependence of dielectric properties such as dielectric loss tangent (tanδ), dielectric constant (ε’) and dielectric loss factor (ε’’) on the frequency has been studied at the room temperature in the frequency range 10 kHz to 5 MHz. The dielectric parameters tanδ, ε’and ε’’ are found to decrease with the increase in the frequency. Further, resistance of the Ge10Se69Tl21 sample is also found to decrease with the increase in the frequency.
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