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Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes

Author(s): Tomasz J. OCHALSKI | Tomasz PIWONSKI | Dorota WAWER | Kamil PIERSCINSKI | Maciej BUGAJSKI | Anna KOZLOWASKA | Andrzej MALAG | Jens W. TOMM

Journal: Optica Applicata
ISSN 0078-5466

Volume: 35;
Issue: 3;
Start page: 479;
Date: 2005;
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Keywords: thermoreflectance | Raman spectroscopy | semiconductor laser

In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.
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