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Antirandom Testing: A Distance-Based Approach

Author(s): Shen Hui Wu | Sridhar Jandhyala | Yashwant K. Malaiya | Anura P. Jayasumana
Machine Fault Signature Analysis

Author(s): Pratesh Jayaswal | A. K. Wadhwani | K. B. Mulchandani
ε-Net Approach to Sensor k-Coverage

Author(s): Giordano Fusco | Himanshu Gupta
Accumulation Point Model: Towards Robust and Reliable Deployment

Author(s): Yong Lin, Zhengyi Le and Fillia Makedon
Analysis of PLC Architectures for Dependable Industrial Applications

Author(s): GERGELY Eugen Ioan | COROIU Laura | POPENTIU-VLADICESCU Florin
A Genetic Algorithm based Two Phase Fault Simulator for Sequential Circuit

Author(s): Dhiraj Sangwan | Seema Verma | Rajesh Kumar
A Multi-Robot Control Architecture for Fault-Tolerant Sensor-Based Coverage

Author(s): Metin Ozkan | Gokhan Kirlik | Osman Parlaktuna | Alpaslan Yufka | Ahmet Yazici
Guest Editorial

Author(s): Kun Mean HOU
High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective

Author(s): Mamun B.I. Reaz | Weng F. Lee | Nor H. Hamid | Hai H. Lo | Ali Y.M. Shakaff
A Graph-based Testing of UML2 Sequence Diagram

Author(s): Yujian Fu and Sha Li
Debugging, Advanced Debugging and Runtime Analysis

Author(s): Salim Istyaq | Aufaq Zargar
Effective Test Case Generation Using Antirandom Software Testing

Author(s): Kulvinder Singh, | Rakesh Kumar | Iqbal Kaur
Hybrid Particle Swarm Optimization for Regression Testing

Author(s): Dr. Arvinder Kaur | Divya Bhatt
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test

Author(s): Yves Joannon | Vincent Beroulle | Chantal Robach | Smail Tedjini | Jean-Louis Carbonero
Automated Test Case Prioritization Using Rgrasp

Author(s): M.Nalini Sri | Lakshmi.A
Empirical Bounds on Fault Coverage LossDue to LFSR Aliasing

Author(s): Warren H. Debany | Mark J. Gorniak | Anthony R. Macera | Daniel E. Daskiewich | Kevin A. Kwiat | Heather B. Dussault
Fault Modeling of ECL for High Fault Coverage of Physical Defects

Author(s): Sankaran M. Menon | Yashwant K. Malaiya | Anura P. Jayasumana
Application of Dynamic Supply Current Monitoring toTesting Mixed-Signal Circuits

Author(s): Mahmoud A. Al-Qutayri | Peter R. Shepherd
Open Source Software Reliability Growth Model by Considering Change- Point

Author(s): V. B. Singh | P. K. Kapur | Mashaallah Basirzadeh
Fault Based Techniques For Testing Boolean Expressions: A Survey

Author(s): Usha Badhera | Purohit G.N | S.Taruna
Error Detection and Reconfigurationin Reliable Ethernet Train Networks

Author(s): Hassanein H. Amer | Magdi S. Moustafa | Mai Hassan | Ramez M. Daoud
-Net Approach to Sensor -Coverage

Author(s): Fusco Giordano | Gupta Himanshu
A Stochastic Combinatorial Optimization Model for Test Sequence Optimization

Author(s): Shuai Wang | Yindong Ji | Shiyuan Yang
Analytical Review of Test Redundancy Detection Techniques

Author(s): Nagendra Pratap Singh | Rishi Mishra | Rajit Ram Yadav
Particle Swarm Optimization Framework for Low Power Testing of VLSI Circuits

Author(s): Balwnder Singh | Sukhleen Bindra Narang | Arun Khosla
Coverage Maintenance using Mobile Nodes in Clustered Wireless Sensor Networks

Author(s): J. Naskath | K.G. Srinivasagan | S. Pratheema
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