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Empirical Study of FFANN Tolerance to Weight Stuck at Max/Min Fault

Author(s): Amit Prakash Singh | Chandra Shekhar Rai | Pravin Chandra
Empirical Study of FFANNs Tolerance to Weight Stuck at Zero Fault

Author(s): Amit Prakash Singh | Pravin Chandra, | Chandra Sekhar Rai
Empirical Study of Least Sensitive FFANN for Weight- Stuck-at Zero Fault

Author(s): Amit Prakash Singh | Pravin Chandra | Chandra Shekhar Rai
Fault Detection Multipliers in Polynomial and Normal Basis

Author(s): Siddharth Shelly | Babu T Chacko
High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective

Author(s): Mamun B.I. Reaz | Weng F. Lee | Nor H. Hamid | Hai H. Lo | Ali Y.M. Shakaff
Fault Modeling of ECL for High Fault Coverage of Physical Defects

Author(s): Sankaran M. Menon | Yashwant K. Malaiya | Anura P. Jayasumana
Advances in VLSI testing at MultiGb per second rates

Author(s): Topisirović Dragan
Using SAT-Based Techniques in Test Vectors Generation

Author(s): Fadi Aloul | Assim Sagahyroon
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