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Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy

Author(s): A. Koehl | H. Wasmund | A. Herpers | P. Guttmann | S. Werner | K. Henzler | H. Du | J. Mayer | R. Waser | R. Dittmann

Journal: APL Materials
ISSN 2166-532X

Volume: 1;
Issue: 4;
Start page: 042102;
Date: 2013;
Original page

Transmission X-ray microscopy is employed to detect nanoscale valence changes in resistive switching SrTiO3 thin film devices. By recording Ti L-edge spectra of samples in different resistive states, we could show that some spots with slightly distorted structure and a small reduction to Ti3+ are already present in the virgin films. In the ON-state, these spots are further reduced to Ti3+ to different degrees while the remaining film persists in the Ti4+ configuration. These observations are consistent with a self-accelerating reduction within pre-reduced extended growth defects.
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