Author(s): Kristen M. Burson | Mahito Yamamoto | William G. Cullen
Journal: Beilstein Journal of Nanotechnology
ISSN 2190-4286
Volume: 3;
Issue: 1;
Start page: 230;
Date: 2012;
Original page
Keywords: graphene | model | noncontact atomic force microscopy | SiO2 | van der Waals
ABSTRACT
Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~30% for tip distances within 5 Å of the surface. Results also indicate a deviation from the Hamaker force law for a sphere interacting with a flat surface.
Journal: Beilstein Journal of Nanotechnology
ISSN 2190-4286
Volume: 3;
Issue: 1;
Start page: 230;
Date: 2012;
Original page
Keywords: graphene | model | noncontact atomic force microscopy | SiO2 | van der Waals
ABSTRACT
Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~30% for tip distances within 5 Å of the surface. Results also indicate a deviation from the Hamaker force law for a sphere interacting with a flat surface.
