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Optically Aligned, Space Resolving, Extreme Ultra-Violet and Soft X-ray Spectrograph

Author(s): Michel Busquet | Frederic Thais | Ghita Geoffroy | Didier Raffestin | J. P. Chièze

Journal: Applied Physics Research
ISSN 1916-9639

Volume: 5;
Issue: 2;
Date: 2013;
Original page

We describe in this paper an extreme ultra-violet/soft X-ray (XUV) spectrograph with high sensitivity, high spectral resolution and spatial resolution, which we developed to record XUV emission from a 10 J laser-irradiated gas jet. This spectrograph uses a flat field grazing incidence grating and a grazing incidence collection and imaging mirror. We designed a system where initial positions of elements can be set with a low accuracy of half a millimeter and where the final alignment is done with a visible light low intensity laser beam. High spectral resolution, good spatial resolution and nominal dispersion function have been achieved. A few illustrative results are presented.
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