Author(s): Vanzillotta P.S. | Soares G. A. | Bastos I. N. | Simão R. A. | Kuromoto N. K.
Journal: Materials Research
ISSN 1516-1439
Volume: 7;
Issue: 3;
Start page: 437;
Date: 2004;
Original page
Keywords: titanium | implant surface | characterization techniques
ABSTRACT
Bone formation around a metallic implant is a complex process that involves micro- and nanometric interactions. Several surface treatments, including coatings were developed in order to obtain faster osseointegration. To understand the role of these surface treatments on bone formation it is necessary to choose adequate characterization techniques. Among them, we have selected electron microscopy, profilometry, atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) to describe them briefly. Examples of the potentialities of these techniques on the characterization of titanium for biomedical applications were also presented and discussed. Unfortunately more than one technique is usually necessary to describe conveniently the topography (scanning electron microsocopy, profilometry and/or AFM) and the chemical state (XPS) of the external layer of the material surface. The employment of the techniques above described can be useful especially for the development of new materials or products.
Journal: Materials Research
ISSN 1516-1439
Volume: 7;
Issue: 3;
Start page: 437;
Date: 2004;
Original page
Keywords: titanium | implant surface | characterization techniques
ABSTRACT
Bone formation around a metallic implant is a complex process that involves micro- and nanometric interactions. Several surface treatments, including coatings were developed in order to obtain faster osseointegration. To understand the role of these surface treatments on bone formation it is necessary to choose adequate characterization techniques. Among them, we have selected electron microscopy, profilometry, atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) to describe them briefly. Examples of the potentialities of these techniques on the characterization of titanium for biomedical applications were also presented and discussed. Unfortunately more than one technique is usually necessary to describe conveniently the topography (scanning electron microsocopy, profilometry and/or AFM) and the chemical state (XPS) of the external layer of the material surface. The employment of the techniques above described can be useful especially for the development of new materials or products.
