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Structural characterization of the nickel thin film deposited by glad technique

Author(s): Potočnik J. | Nenadović M. | Jokić B. | Štrbac S. | Rakočević Z.

Journal: Science of Sintering
ISSN 0350-820X

Volume: 45;
Issue: 1;
Start page: 61;
Date: 2013;
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Keywords: glancing angle deposition | force modulation atomic force microscopy | nickel | cross section

In this work, a columnar structure of nickel thin film has been obtained using an advanced deposition technique known as Glancing Angle Deposition. Nickel thin film was deposited on glass sample at the constant emission current of 100 mA. Glass sample was positioned 15 degrees with respect to the nickel vapor flux. The obtained nickel thin film was characterized by Force Modulation Atomic Force Microscopy and by Scanning Electron Microscopy. Analysis indicated that the formation of the columnar structure occurred at the film thickness of 1 μm, which was achieved for the deposition time of 3 hours. [Projekat Ministarstva nauke Republike Srbije, br. III45005]

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