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Unprecedented grain size effect on stacking fault width

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Author(s): A. Hunter | I. J. Beyerlein

Journal: APL Materials
ISSN 2166-532X

Volume: 1;
Issue: 3;
Start page: 032109;
Date: 2013;
Original page

ABSTRACT
Using an atomistic-phase field dislocation dynamics model, we isolate and investigate grain size and stress effects on the stacking fault width created by partial dislocation emission from a boundary. We show that the nucleation stress for a Shockley partial is governed by size of the boundary defect and insensitive to grain size. We reveal a grain size regime in which the maximum value the stacking fault width attains increases with grain size.
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