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XRD Characterization of AlN Thin Films Prepared by Reactive RF-Sputter Deposition

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Author(s): N. Matsunami | H. Kakiuchida | M. Sataka | S. Okayasu

Journal: Advances in Materials Physics and Chemistry
ISSN 2162-531X

Volume: 03;
Issue: 01;
Start page: 101;
Date: 2013;
Original page

Keywords: Aluminum Nitride Film | Composition | Impurities | Atomic Structure | Surface Morphology | Optical Properties

ABSTRACT
AlN thin films have been grown on R((1-12) surface-cut)-Al2O3, SiO2-glass and C((001) surface-cut)-Al2O3 substrates, by using a reactive-RF-sputter-deposition method. X-ray diffraction (XRD) shows that AlN film has (110) orientation of wurtzite crystal structure for R-Al2O3 and (001) orientation for SiO2-glass and C-Al2O3 substrates. The film thickness was analyzed by Rutherford backscattering spectroscopy (RBS) and it appears that XRD intensity does not show a linear increase with the film thickness but a correlation with the stress, i.e., deviation of the lattice parameter of the film from that of bulk. The film composition and impurities have been analyzed by ion beam techniques. Effects of high-energy ion beams are briefly presented on atomic structure (whether stress relaxation occurs or not), surface morphology and optical properties.
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